SM3251_321CC_2009_I0209
2009.02.09
1、 extend the pretest time out to 60 mins.
2009.02.08
1、Modify level90 run 2plane just mark the orginal bad block;
2、Modify level100 run single plane just mark the orginal bad block;
2009.01.16
1、Modify level02&level03 ,all the program action is running two plane mode to improve the speed;
2、Modify level09 for Toshiba 43nm ,the reserve block change to 10;
2009.01.14
1、level02 is from level01 for Mrcion;
2、level03 is from level01 for Intel;
2009.01.07
1、fix a bug of pretest code;
2008.12.31
1、add Mrion 34nm
2008.12.25
1、Toshiba 43nm:open ignore erase&program and change pattern;
2、update Toshiba 43nm isp code;
ps:
level04: for G-Tek DG Flash will be better(is level12 change pattern);
level09: is just for Toshiba 43nm.
2008.12.16
1. support toshiba 43nm DG flash in Level 9;
2. add level 01 for more stick test pattern for Hopestar.
Ps: Level 10: Write 2plane; read 1plane
Llevel 11: write/read 1plane
Level 12: page compare + block compare.
Level 100: refer the original bad, 1 plane
Level 90: refer the original bad , 2plane
2008.06.25
1.Modify Clock Setting in DBF file
*divide 0x180 bit5 write clock by 2
*divide 0x181 bit6 read clock by 2
*divide 0x180 bit6 read clock by 2
冘2.Modify Pattern Level 7, which is faster flash initialization than Level 11
2008.06.10
1. Improve scan performance
2. Improve yield rate
3. Update flash test pattern LV8, LV9, and LV10
4. Default set to LV10
2008.05.15
1. Add Level 100
2009.05.09
1. Improve Stability
2. Update DBF table
2008.02.27
Here are the update and release note:
1. Update ISP to align with latest ISP(G1228)
2. Improve Fast Flash Initialization
3. Modify LED display
4. Update Flash test pattern Level 11, 12, 13
